Software for CV and IV analysis

Software to analyze Capacitance Voltage (CV), Current Voltage (IV) and CV Hysteresis experimental data and extraction of the relevant parameters for electrical characterization of MOS capacitors.

Measured data (CV and IV from MOS system) from a batch of wafers and many dies in a wafer is analyzed in an automated manner, using industry standard analysis procedure.

Prof. Souvik Mahapatra, Electrical Engineering