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Industrial Research And Consultancy Centre

X-ray diffractometer facility

X-ray diffraction (XRD) is an instrumental technique to study crystalline materials. On diffraction of the X-ray beam from the sample, the distances between the planes of the atoms constituting the sample can be obtained by applying the Bragg's law
Make and Model
Rigaku, Smartlab
Available mode for use
Powder XRD Thin film XRD and GIXRD High temperature XRD X-ray reflectivity
  • X-Ray reflectivity measurement
  • In-situ electrochemical measurements
  • In-situ high temperature XRD measurement
  • Identification of unknown crystalline materials
  • Characterization of crystalline materials
  • Determination of crystal structures using Rietveld refinement
  • Thin film characterization
  • Determining thickness, roughness and density of thin films


Faculty in-charge
Contact Email

Short circuit Lab (near powerhouse) IIT Bombay, Powai Mumbai 400076

Contact No: 022 2576 4840