X-ray Diffraction @MEMS
Application
- Phase Identification of unknown crystalline materials.
- Characterization of crystalline materials.
- Determination of crystal structures using Rietveld refinement.
- Thin film characterization.
- SAXS method is useful for the structural characterization of nanomaterials. The samples may be solid objects, powders, gels or liquid dispersions, and they may be amorphous, crystalline or semi-crystalline.
- Complete Functional system for Phase Analysis & Crystallography.
- Thin film attachment (GIXRD) & reflectivity measurements.
- Small angle and wide angle X-ray scattering (SAXS/WAXS) measurements & accessories for solids, composites as well as powder as per technical specifications.
Faculty in-charge
Contact Email
xrdatmems@iitb.ac.in
Location
Room No -G022 ,Ground Floor, Department of Metallurgical Engineering and Materials Science.
Contact No: 022 21593603
Other Contact Person
- Mr. Hitesh Thakur