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Industrial Research And Consultancy Centre

High resolution X-ray diffraction system at Physics

This facility enables to obtain information about the lattice structure as well as crystalline quality of a material by measuring the angular distribution of intensity about the maxima.
Make and Model
Smartlab, Rigaku diffractometer
Available mode for use
Bragg -Brentano optics (Conventional divergent beam): Johnson mirror and Ni filter Parallel beam optics: Horizontal and vertical goniometer Soller slits: Horizontal and vertical (medium resolution) 2 & 4 Bounce Ge(220), Ge(400) channel-cut monochromators and analyzers (high resolution)
  • High intensity X-ray source (9kW rotating anode source)
  • Parallel beam optics. (useful for microstructural characterization)
  • High resolution goniometer
  • In-plane goniometer (useful for in-plane microstructural studies for the thinfilms)
  • Microstructural characterization of epitaxial films
  • Phase determination and texture analysis of polycrystalline samples with higher accuracy.
  • Reflectivity measurements: layer thickness, composition, roughness of thinfilms


Faculty in-charge
Contact Email

Room No. 016, Ground Floor, Department of Physics IIT Bombay, Powai Mumbai 400076

Contact No: 022 2576 4570

Other Contact Person
  • Rajendra K. Saroj