Field emission gun based scanning electron microscope facility

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Description

Field emission gun based scanning electron microscope facility is used to obtain high resolution images of materials, cells, and tissues at the micron, sub-micron, and nanometer scale. This facility be integrated with a serial sectioning device to achievesequential SEM images of materials following serial sectioning.

Make and Model

JEOL, JSM 7600F

Available mode for use

Cryo mode: Hydrated samples Normal mode: Dry samples

Specifications/Features

Magnification: 25 to 1000000x
Resolution : 1.2nm
Accelerating voltage: 0.1 to 30kV
Beam current: 1pA to 200nA at 15kV
Working distance: 1.5mm to 10mm
Variable temperature conduction cooled specimen stage (-185°C to 50°C),temperature stability of > 1°C
Fully automatic, high resolution sputter coater with platinum (Pt) target

Application

Nanotechnology, Biology and Life Sciences, Material Science, Pharmaceutical Analysis, Semiconductors.
The main advantages of using a Cryo-SEM over a normal SEM are listed below:
Specimen viewed in its fully hydrated state
Soluble materials are retained
Little or no mechanical damage to the specime
Ideal for time resolved experiments (biological and industrial)
High resolution capability (compared to low-vacuum techniques)
Extra information obtained by low-temperature fracturing
Excellent for liquids, semi-liquids and beam sensitive specimens
Rapid process â€“ typically 5-10 minutes
Food science, Biological science, Material science

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