Field emission gun based scanning electron microscope facility
Description
Field emission gun based scanning electron microscope facility is used to obtain high resolution images of materials, cells, and tissues at the micron, sub-micron, and nanometer scale. This facility be integrated with a serial sectioning device to achievesequential SEM images of materials following serial sectioning.
Make and Model
JEOL, JSM 7600F
Available mode for use
Cryo mode: Hydrated samples Normal mode: Dry samples
Specifications/Features
- Magnification: 25 to 1000000x
- Resolution : 1.2nm
- Accelerating voltage: 0.1 to 30kV
- Beam current: 1pA to 200nA at 15kV
- Working distance: 1.5mm to 10mm
- Variable temperature conduction cooled specimen stage (-185°C to 50°C),temperature stability of > 1°C
- Fully automatic, high resolution sputter coater with platinum (Pt) target
Application
- Nanotechnology, Biology and Life Sciences, Material Science, Pharmaceutical Analysis, Semiconductors.
- The main advantages of using a Cryo-SEM over a normal SEM are listed below:
- Specimen viewed in its fully hydrated state
- Soluble materials are retained
- Little or no mechanical damage to the specime
- Ideal for time resolved experiments (biological and industrial)
- High resolution capability (compared to low-vacuum techniques)
- Extra information obtained by low-temperature fracturing
- Excellent for liquids, semi-liquids and beam sensitive specimens
- Rapid process – typically 5-10 minutes
- Food science, Biological science, Material science
Faculty in-charge
Contact Email
cryofegsem@iitb.ac.in
Location
Chemical Engineering Sophisticated Instrument Laboratory, Near CAD center (TCS Area), I.I.T. Bombay, Powai, Mumbai - 400076
Contact No: +91 22 2576 4201
Other Contact Person
- Ms. Meena Menghrajani
Facility Management Members