The invention disclosed is a latch designed to withstand single event soft errors (SE), particularly in digital circuits vulnerable to transient faults caused by cosmic rays or alpha particles. It features a flexible architecture comprising different configurations of p-channel and n-channel transistors (1P-2N or 2P-1N), coupled with auxiliary elements like back-to-back inverters or 3-input C-elements. A clocked circuit module ensures proper timing, enabling the latch to operate in transparent mode for writing data and in hold mode for storing data securely. This SE-tolerant design aims to mitigate soft errors in memory cells and sequential logic, enhancing reliability in scaled-down digital circuits prone to environmental disturbances.
- Integrates multiple transistor configurations (1P-2N and 2P-1N) for adaptive resilience against soft errors.
- Utilizes auxiliary elements such as back-to-back inverters and 3-input C-elements for enhanced error detection.
- Includes clocked circuit modules to ensure precise timing for data storage and retrieval.
- Operates in both transparent and hold modes, facilitating seamless data writing and stable storage.
- Addresses single event soft errors in digital circuits, crucial for reliability in space and medical technology.
- Offers flexibility in configuration to optimize performance based on specific application requirements.
- Integrates multiple transistor configurations (1P-2N and 2P-1N) for adaptive resilience against soft errors.
- Utilizes auxiliary elements such as back-to-back inverters and 3-input C-elements for enhanced error detection.
- Includes clocked circuit modules to ensure precise timing for data storage and retrieval.
- Operates in both transparent and hold modes, facilitating seamless data writing and stable storage.
- Addresses single event soft errors in digital circuits, crucial for reliability in space and medical technology.
- Offers flexibility in configuration to optimize performance based on specific application requirements.
The complete circuit is simulated and the results are demonstrated using circuit simulation.
The complete circuit is simulated and the results are demonstrated using circuit simulation.
3
- Enhances reliability of medical devices and space exploration technology by reducing errors caused by environmental factors.
- Improves data accuracy in critical applications, ensuring safety and efficiency in digital systems used in healthcare and aerospace industries.
Biomedical, aerospace and defense, space agency, semiconductors
- Used in spacecraft electronics to ensure reliability and accuracy of data transmission.
- Applied in medical equipment to maintain consistent performance and data integrity during patient monitoring.
2806/MUM/2015
452539