The invention disclosed is a latch designed to withstand single event soft errors (SE), particularly in digital circuits vulnerable to transient faults caused by cosmic rays or alpha particles. It features a flexible architecture comprising different configurations of p-channel and n-channel transistors (1P-2N or 2P-1N), coupled with auxiliary elements like back-to-back inverters or 3-input C-elements. A clocked circuit module ensures proper timing, enabling the latch to operate in transparent mode for writing data and in hold mode for storing data securely. This SE-tolerant design aims to mitigate soft errors in memory cells and sequential logic, enhancing reliability in scaled-down digital circuits prone to environmental disturbances.
Type of IP
Faculty
Category of Patent
Department
- Enhances reliability of medical devices and space exploration technology by reducing errors caused by environmental factors.
- Improves data accuracy in critical applications, ensuring safety and efficiency in digital systems used in healthcare and aerospace industries.
- Integrates multiple transistor configurations (1P-2N and 2P-1N) for adaptive resilience against soft errors.
- Utilizes auxiliary elements such as back-to-back inverters and 3-input C-elements for enhanced error detection.
- Includes clocked circuit modules to ensure precise timing for data storage and retrieval.
- Operates in both transparent and hold modes, facilitating seamless data writing and stable storage.
- Addresses single event soft errors in digital circuits, crucial for reliability in space and medical technology.
- Offers flexibility in configuration to optimize performance based on specific application requirements.
- Integrates multiple transistor configurations (1P-2N and 2P-1N) for adaptive resilience against soft errors.
- Utilizes auxiliary elements such as back-to-back inverters and 3-input C-elements for enhanced error detection.
- Includes clocked circuit modules to ensure precise timing for data storage and retrieval.
- Operates in both transparent and hold modes, facilitating seamless data writing and stable storage.
- Addresses single event soft errors in digital circuits, crucial for reliability in space and medical technology.
- Offers flexibility in configuration to optimize performance based on specific application requirements.
3
The complete circuit is simulated and the results are demonstrated using circuit simulation.
Biomedical, aerospace and defense, space agency, semiconductors
- Used in spacecraft electronics to ensure reliability and accuracy of data transmission.
- Applied in medical equipment to maintain consistent performance and data integrity during patient monitoring.