Transmission Electron Microscopy Facility (300 kV)@MEMS

The transmission electron microscope is a 300kV high-resolution microscope with a field emission gun and excellent analytical performance. This facility is used for analysis of elemental composition by energy dispersive spectroscopy, diffraction for crystal structure determination and crystallographic studies.

Make and Model

Thermo Scientific, Themis 300 G3

Available mode for use

  • Conventional TEM mode

    Scanning TEM mode

    Spectrum Imaging (EDS)


    Local Orientation and Stress (A-Star) – to be installed with RIFC support.

    Available detectors :

    Super-X (EDS), Conventional TEM and STEM


  • Point resolution – 0.2 nm for TEM, 0.12 nm for STEM

    Information limit – 0.18 nm

    Minimum Brightness – 9.88 x 107 A/m2srV

    EDS energy resolution at Mn – 125 eV

    Maximum spot drift – 0.45 nm/min


  • Deformation in metals

    Nano science/Nano Technology

    Thin Films

    Energy Science/Engineering

    Chemical composition and quantification (TEM)

    Elemental Mapping (STEM)


Facility in-charge

Contact Email

temcoest[at] iitb[dot] ac[dot] in


Room No. 027, Ground Floor, MEMS Department.

Other contact person(s)

  • Prakash Ishte

Registration Link:

Submit New Request

FEG featuring a high brightness and a high stability realizes structural imaging at atomic resolution.

Highly bright sub-nanometre sized probe enables us to perform an ultimately sensitive analysis of a sample at sub-nanometre resolution.

Super-X, an arrangement of 4 EDS detectors, for fast and reliable spectrum acquisition.

With optionally available piezo specimen drive system, specimen can be shifted at sub-nanometre resolution with a range of ± 1.2 μm.

A tomography holder for electron tomography application with tilt range of ±70o.

Local Orientation and Stress (A-Star) – to be installed with RIFC support.

Innovative scientific technologies used in today's nanotechnology are making remarkable progress. In research on localized strain measurement, novel materials such as carbon nanotubes, semiconductors and ceramics, as nanometre-scale evaluation and analysis are essential. This electron microscope is equipped with a field emission electron gun (xFEG) that produces high and is highly stable. This feature is essential for Nano-scale ultrahigh resolution analysis. HRTEM has an imaging mode that allows the imaging of the crystallographic structure of a sample at an atomic scale. Because of its high resolution, it is an invaluable tool to study Nano scale properties of crystalline material such as semiconductors, ceramics, metals, etc. HRTEM is the tool useful in imaging (semiconductor, core-shell nanoparticles, grain boundaries, etc.), to see structure details of nanotubes, nanowires, nanoparticles and so on.

Central facility presentation
Publications using data from this facility

a) Kankona Singha Roy et al., ACS Appl. Mater. Interfaces, 13(8) (2021) 9897-9907

b) Anagha Pradeep et al., Elec. Acta, 362 (2020) 137122

c) P. Manikandan et al., MMTA, (2021)

d) Agrawal et al., MMTA, 52 (2021) 1465-1476

Instructions for sample preparation/submission
  • The bulk samples has to be of 3 mm diameter.
  • The user has to collect TEM grids for powder samples from STEM lab.
  • The user has to come for STEM analysis with prepared sample.
  • The samples should be prepared on TEM grids of 3 mm size and sample thickness should be less than 100 nm for high resolution images.
  • Any query related to your FEG-TEM analysis can be emailed to temcoest [at] iitb [dot] ac [dot] in ()

The samples should be dry and should withstand ultra-high vacuum

Instructions for Users
  • Registration is online through drona interface.
  • Intimation of appointment by email.
  • New users are requested to contact first.

Cancellation/postponing a slot – at least 24 h earlier.