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Industrial Research And Consultancy Centre

Scanning probe microscope facility - I



Scanning probe microscopy facility allows researchers to observe and manipulate molecular and atomic level features. This technique helps to study a 3D profile of the surface on a nanoscale.
Make and Model
Agilent, Switzerland, Model: 5500
Available mode for use
Atomic force microscopy-contact, non-contact and tapping mode Lateral force microscopy-stiffness, frictional forces Magnetic force microscopy-changes in the phase of the cantilever due to interatomic magnetic force Scanning tunneling microscopy Electrostatic force microscopy-Phase response of the cantilever induced by the interaction of the conducting tip and the electrostatic field of the sample surface Kelvin force microscopy-contact potential difference between tip and sample Time series (with or without Z-stack)
  • Highly modular microscope and scanner
  • Optional integrated environmental & temperature control
  • Easy sample access with top-down scanning
  • ZEnvironmental chamber allows imaging in controlled atmospheres. Ports and fittings enable gases, liquids and probes to be introduced to the chamber
  • Scanners : Lateral range X-Y imaging area up to 90μm square; Lateral noise X-Y 0.05nmVertical (Z) range ¡ 8μm; Vertical (Z) noise Level ≤ 0.05nm
  • Life Science
  • Meterial Science
  • Polymer Science
  • Electrical characterization
  • Nanolithography
  • Nanografting
  • Biotechnology


Faculty in-charge
Contact Email

Nanoindentation Laboratory (at Basement), Department of Metallurgical Engineering & Material Science, I.I.T. Bombay, Powai, Mumbai - 400076

Contact No: 02225764613

Other Contact Person
  • Prof. Dipti Gupta