Skip to main content
Industrial Research And Consultancy Centre

Central surface analytical facility

Electron spectroscopy for chemical analysis instrument is used for characterisation of surfaces and interfaces. It can provide great deal of information such as elemental composition, chemical state composition of elements present, spatial distribution of elements and their chemical state, composition as a function of depth, Central Surface Analytical Facility thickness of thin films etc.
Make and Model
Kratos Analytical, AXIS Supra
  • High transmission electron energy analyzer
  • High flux dual anode X-ray, high flux UVsource and monochromatic X-ray source
  • AES/SEM/SAM electron gun
  • Low energy charge neutralisation source
  • Broad spot sample cleaning source
  • ESCA is a surface analytical tool (up to depth ~1nm) :
  • Elemental composition of surface and quantification of there relative concentrations with some limitations
  • Chemical states of elements
  • Relative quantification of chemical state of each element
  • Thickness of thin films
  • Depth profiling
  • Spatial distribution of material


Contact Email

ESCA Lab #040, Dept. of Physics Indian Institute of Technology Bombay Powai, MUMBAI 400076

Contact No: 022-2159 6518

Other Contact Person
  • Ms. Smita Sahu
  • Dr. D.S. Sutar
Facility Management Members

Prof. Subramaniam Chandramouli 
Prof. Maniraj Mahalingam 
Prof. Amartya Mukhopadhyay 
Prof. Manoj Neergat 
Prof. Saurabh Vijaykumar Lodha 
Prof. T Kundu 
Prof. Rohit Srivastava 
Prof. Debabrata Maiti 
Prof. Rajdip Bandyopadhyaya 
Prof. Smrutiranjan Parida 
Prof. Dinesh Kabra 
Prof. R Murugavel 
Prof. Shaibal K. Sarkar 
Prof. Sankara Sarma V. Tatiparti 
Prof. Ashutosh Gandhi  
Prof. Arindam Sarkar


More Details Here..