Field emission gun-transmission electron microscope facility-200 kV facility
Booking Link
Description
Transmission Electron Microscopy technique uses a beam of high energy electrons which is transmitted through a very thin sample to form an image/diffraction pattern to reveal the information about morphology and crystallography. 200kV Field emission gun-transmission electron microscope produces high brightness which is useful for imaging of the crystallographic structure of a sample at an atomic scale resolution up to (2 A0).
Make and Model
JEOL, JEM-2100F
Available mode for use
TEM Bright field/dark field imaging HR-TEM imaging Diffraction pattern
Specifications/Features
- EM-20014 ultrahigh resolution
- Point resolution : 0.19nm
- Lattice resolution : 0.1nm
- Magnification : 50x to 1,500,000x
- Acc. voltage : 120kV, 200kV
- Electron gun emitter : ZrO/W(100)
- Brightness : 34 x 108 A/(cm2.sr)
- Pressure : On the order of 10-8 Pa
- Probe current : >=0.5nA for 1nm probe
Application
- Nano science/Nano Technology
- Micro/Nano electronics
- Thin Films
- Catalysis
- Corrosion
- Polymer Science
- Energy Science/Engineering
- Biological and life sciences
Faculty in-charge
Contact Email
fegtemlab@iitb.ac.in
Location
Room No: 315 - A Ground floor, CRNTS/SAIF, IIT Bombay, Powai, Mumbai - 400 076.
Contact No: 022-2159 6865
Other Contact Person
- Mr. Anand Mehta
- Mrs. Aradhana P. Naudiyal
- Dr. Bharati Patro