Conductive atomic force microscope facility
Description
This facility helps to map topography and morphology of samples. It can measure electrical, magnetic and piezo-electric behaviour of the surface using suitable probes.
Make and Model
Asylum/Oxford Instruments, MFP3D Origin
Available mode for use
Contact mode Non contact mode
Specifications/Features
- Has a maximum scan area of 90x90 μm2 and minimum scan area is around 10 to 30nm. Maximum scan depth is 14μm and minimum can be a few nanometres
- Good external noise isolation
- High speed pulse measurement capability through tip
Application
Material characterization applications including thin dielectric films, nanotubes,conductive polymers, and others Characterize ferroelectric and Piezoelectric materials
Faculty in-charge
- Prof. Udayan Ganguly
Contact Email
cafm@iitb.ac.in
Location
Char2 Lab Second Floor, EE Annexe
Department of Electrical Engineering,
I.I.T. Bombay, Powai,
Mumbai - 400076
Contact No:022-2576 4419
Other Contact Person
- Shweta Nair