The X-Ray Diffraction System SmartLab SE includes the SmartLab SE Goniometer with a scanning radius of 300 mm (diameter 600 mm) and a 3 kW sealed ceramic Cu X-ray tube. The maximum tube voltage is 60 kV, and the maximum tube current is 60 mA. The DTex 250 sensor is a semiconductor strip sensor with an active area of 384 mm² (19.2 x 20 mm). The system features an automatic slit exchanger with alignment and control, along with automatic systematic error correction. The solar slits are available in 2.5 degrees and 5 degrees for the incident and diffracted beams, respectively, and are easily interchangeable. Additionally, the system includes a Ni filter. The minimum step angle is 0.0001 degrees, and the scanning angle range is -10 to +160 degrees in 2 theta.

The enclosed cabinet has doors designed for easy access and adheres to regulations for X-ray, electrical, and mechanical safety. Additionally, the system includes Data Collector software, which provides functionalities such as data acquisition in an appropriate format, tools for determining measurement strategies, configuration and measurement management, automatic processing, and data conversion and viewing capabilities for X-ray diffraction system.

The High-Temperature Attachment (HT-XRD) can operate from ambient temperature up to 1500°C in air, up to 1450°C in a vacuum, and up to 1300°C in an inert gas. It is equipped with a JIS Type (2) thermocouple. The sample size is 13.5 x 25 x 0.5 mm. The HT-XRD attachment can only run once in a day.

X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample. The interaction of the incident rays with the sample produces constructive interference (and a diffracted ray) when conditions satisfy Bragg's Law (nλ=2d sin θ). This law relates the wavelength of electromagnetic radiation to the diffraction angle and the lattice spacing in a crystalline sample. These diffracted X-rays are then detected, processed and counted. By scanning the sample through a range of 2θangles, all possible diffraction directions of the lattice should be attained due to the random orientation of the powdered material. Conversion of the diffraction peaks to d-spacings allows identification of the mineral because each mineral has a set of unique d-spacings. Typically, this is achieved by comparison of d-spacings with standard reference patterns.

For powdered samples: kindly submit completely dried and powdered samples only. For thin/thick films: the sample dimensions should not be more than 1cm x 1cm. The user must submit the duly filled and signed form along with the samples. No more than 5 samples will be accepted per user per form.