All Research Facilities

Scanning electron microscope facility

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Scanning electron microscope facility (SEM) is able to scan a sample with a focused electron beam and deliver images with information about the sample's topography and composition. It is a highly flexible high definition imaging and analysis tool delivering fast, accurate and repeatable results across all samples

Make and Model

Carl Zeiss SMT Ltd., Zeiss EVO 18

Specifications/Features

  • Filament: Tungsten

  • Secondary e-image resolution: 50nm (depends on sample)

  • BSD detector

  • Tilt: 0-60 degree

  • Rotation: 360 degree

  • EHT: 200V-30kV

  • Magnification: Up to 50K~100K (depends on sample)

Facility in-charge

Contact Email

diksha[at] ee[dot] iitb[dot] ac[dot] in

Location

Room no. 008, Structural Characterization Laboratory, ground floor, DESE building

(w.e.f. )

Registration Link:

http://www.ncpre.iitb.ac.in