Scanning electron microscope facility


Scanning electron microscope facility (SEM) is able to scan a sample with a focused electron beam and deliver images with information about the sample's topography and composition. It is a highly flexible high definition imaging and analysis tool delivering fast, accurate and repeatable results across all samples

Make and Model

Carl Zeiss SMT Ltd., Zeiss EVO 18


  • Filament: Tungsten

  • Secondary e-image resolution: 50nm (depends on sample)

  • BSD detector

  • Tilt: 0-60 degree

  • Rotation: 360 degree

  • EHT: 200V-30kV

  • Magnification: Up to 50K~100K (depends on sample)

Contact Email

diksha[at] ee[dot] iitb[dot] ac[dot] in


Room no. 008, Structural Characterization Laboratory, ground floor, DESE building

(w.e.f. )

Registration Link: