Contact resistance scan system

This solar cell characterisation instrument allows the visualization of various energy loss locations across the cell and helps in optimisation of various process parameters.

Make and Model

Mechatronics Manufac turing, BV/SCRA 10: 9001

Available mode for use

  • Core (contact resistance) scan: Full surface measurement of contact resistance of front side metallisation

  • Shunt scan: Locates shunts on solar cells and finds out about their nature

  • Open circuit voltage (Voc) scan: Finds the locations of increased recombination

  • LBIC (Light beam induced current) scan: Finds the regions on a solar cell with reduced short-circuit current density. 


  • Solar cell dimensions: 50-215mm

  • Solar cell shapes: round, semi-square, and rectangular

  • Maximum probe speed: 20mm/s

  • Special resolution: 0.1mm

  • Lamp intensity: 150-300mW/cm2

  • Lamp homogeneity: >95%

  • Voltage range: 0-1000mV

Facility in-charge

Contact Email

anilkg[at] ee[dot] iitb[dot] ac[dot] in


NCPRE Characterisation Lab,

3rd Floor,Nano Electronics Building

Department of Electrical Engineering

(w.e.f. )

Registration Link: