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Indian Institute of Technology Bombay, Mumbai
IIT Bombay
Industrial Research and Consultancy Centre
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Areas Of Expertise
CAD tools for reliable VLSI designs
Device simulation
Digital hardware
Fault - simulators for VLSI circuits
Microelectronics
Power electronics
Radiation damage in MOS device
Reliability of electronic devices and systems
Semiconductor devices
VLSI
VLSI design
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Nitrided oxides
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Halo doping
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MOSFET optimization
p-MOSFET
Oxynitrides
SILC
Temperature dependence of interface trap generation
Ultra-thin oxides
Geometric mean distance (GMD)
Horizontal tunability
Mutual inductance
Vertical tunability
Process variability
Response designs
Response surface
Mutual inductance parameter
Self-resonance frequency (SRF)
Track segments
CMOS
Design of experiments
Principal component analysis
Process variations
Response surface methodology
Variability
Analog integrated-circuits
Device simulation
Optimization
Design
Technologies
Sensitivity
Methodology
Design of experiments
Principal component analysis
Process variations
Response surface methodology
Variability
Technologies for Licensing
Apparatus to measure polarization state of an incoming wave using orthogonal element array
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